The structure of dissociated screw dislocations was analyzed by means of high-resolution electron microscopy and image simulation. The stacking fault was always found to be intrinsic, with an energy of 45mJ/m2. A comparison of experimental and simulated images suggested that partial dislocation motion occurred during observation and that interaction of the dislocation core with point defects severely limited the determination of the dislocation core structure in terms of glide or shuffle models.

High-Resolution Microscopy of Dissociated Screw Dislocations in GaAs. B.C.de Cooman, C.B.Carter: Physica Status Solidi A, 1989, 112[2], 473-92