Images of end-on views of extended 60°- and screw dislocations in single crystals were observed using a high-voltage electron microscope in axial illumination mode. The mean width of 60° dislocations was measured to be 68.7Å, from which the energy of the intrinsic stacking fault was estimated to be 48.7mJ/m2.

HVEM Structure Images of Extended 60°- and Screw Dislocations in Silicon. M.Sato, K.Hiraga, K.Sumino: Japanese Journal of Applied Physics, 1980, 19[3], L155