The diffusion of Zr in -Ti was measured, at  823 to 1133K, by using ion beam analysis techniques to determine diffusion profiles. Conventional Rutherford back-scattering with He ions was used at 823 to 1012K, and heavy-ion Rutherford back-scattering was used at 873 to 1133K. Arrhenius plots of the data could be described by:

D (cm2/s) = 4.3 x 101 exp[-72.4(kcal/mol)/RT]

Agreement was fairly good within the temperature range where both techniques were used.

R.A.Perez, F.Dyment, H.Matzke, G.Linker, H.Dhers: Journal of Nuclear Materials, 1994, 217[1-2], 48-53