The diffusion of Pd through the grain boundaries of thin polycrystalline Ag films was studied. Auger electron spectroscopy was used to determine the composition of the top-most layers. Principal component analysis and factor analysis were used to decompose the Auger spectra, which were recorded during annealing, into contributions that arose from particular constituents. The techniques also confirmed the presence of C, and permitted an evaluation of the amount of this element in the system.

Grain Boundary Diffusion of Pd through Ag Thin Layers Evaporated onto Polycrystalline Pd in High Vacuum Studied by Means of AES, PCA and FA. G.Balcerowska, A.Bukaluk, R.Siuda, J.Seweryn, M.Rozwadowski: Vacuum, 1999, 54[1-4], 93-7