Low-angle boundaries in modified Lely crystals were studied by using high-resolution X-ray diffraction and molten KOH etching. The defect-selective etching revealed that the low-angle grain boundaries were polygonized into <1¯1•0> directions and occurred more often in the peripheral parts of the crystal. The relative misorientations between adjacent sub-grains were studied by means of high-resolution X-ray diffraction, and it was found that tilting of the (00•1) lattice plane occurred at the low-angle grain boundaries and had a rotation axis which was parallel to the boundary plane.

Investigation of Low Angle Grain Boundaries in Modified-Lely SiC Crystals by High Resolution X-Ray Diffractometry M.Katsuno, N.Ohtani, T.Aigo, H.Yashiro, M.Kanaya: Materials Science Forum, 2000, 338-342, 493-6