The structural properties of low-angle grain boundaries in modified Lely crystals were studied by using high-resolution X-ray diffraction and molten KOH defect-selective etching. Such etching revealed that the low-angle grain boundaries were polygonized into <1¯1▪0> directions, and occurred more often at the periphery of the crystal. The relative misorientation between adjacent sub-grains was examined by means of high-resolution X-ray diffraction, and it was found that tilting of the (00▪1) lattice plane occurred at the low-angle grain boundaries and had a rotation axis which was parallel to the boundary plane.

Investigation of Low Angle Grain Boundaries in Modified-Lely SiC Crystals by High Resolution X-Ray Diffractometry. M.Katsuno, N.Ohtani, T.Aigo, H.Yashiro, M.Kanaya: Materials Science Forum, 2000, 338-342, 493-6