The application of the large-angle convergent-beam electron diffraction technique to the determination of the displacement vector at a S3 grain boundary in Cu-at%Si was described. It was shown that, in large-angle convergent-beam diffraction, many high-index reciprocal coincident site reflections could be used to obtain the phase factor of the dot-product with the displacement vector; thus permitting highly accurate determinations of the latter. The value of the displacement vector at an asymmetrical boundary of (121)/(525) in a (¯12¯1) twin was accurately found. The result indicated that there was no excess volume at that boundary.

LACBED Study of a S3 Grain Boundary in a Cu-6at%Si Alloy. H.S.Kim, P.Goodman, A.Schwartzman, P.Tulloch, C.T.Forwood: Ultramicroscopy, 1999, 77[1-2], 83-95