By using micro-beam proton-induced X-ray emission and Rutherford back-scattering spectroscopic techniques, the occurrence of local surface segregation of Al in an Fe layer was detected for the first time in the initial stages of high-dose (8 x 1016 to 2 x 1017/cm2) implantation. By using a slow positron beam, a profile of vacancy defects whose depth was comparable to the depth profile of implanted Al ions (5 x 1017/cm2) was measured. These regions, with a local surface segregation of Al, were partially amorphized after bombardment to 2 x 1017/cm2; according to conversion electron Mössbauer spectra.

Certain Features of High-Dose and Intensive Implantation of Aluminium Ions in Iron. A.D.Pogrebnjak, V.T.Shablia, N.A.Pogrebnjak, R.Sandrik, A.Zecca, S.N.Bratushka: Surface and Coatings Technology, 1998, 110[1-2], 35-9