The diffusion of Al in near-surface layers of Al-implanted austenitic stainless steel was studied by means of ion-beam analysis, at temperatures of between 450 and 650C. The Al profiles were measured by using the 992keV resonance of the 27Al(p,γ)28Si nuclear reaction and 4He+ Rutherford back-scattering spectrometry.

F.Noli, P.Misaelides, K.Bethge: Nuclear Instruments and Methods in Physics Research B, 1998, 139[1-4], 322-6