Calculations were made of the constant force lines and profiles of the lateral force components which were experienced when scanning an atomic force microscope tip over a close-packed surface which contained a vacancy-type defect. Allowance was made for the displacement of the surface atoms. Various scanning modes could exist, depending upon the scanning force. One involved no change in the surface, one involved a single jump of the defect contrary to the scanning direction, and the third involved the dragging of the vacancy behind the tip. It was shown that the calculated lines of constant force could indicate which regime was relevant. The profiles of the lateral force component could be used to make quantitative estimates of the vacancy migration energy.

The Feasibility of Determining Vacancy Migration Energy by Atomic Force Microscopy Data. E.V.Blagov, G.L.Klimchitskaya, V.M.Mostepanenko: Surface Review and Letters, 1998, 5[2], 559-67