Acceptors and vacancy-type defects were investigated in travelling-heater Hg0.8Cd0.2Te crystals by measuring positron lifetimes after 2.5MeV electron irradiation in liquid H, and annealing at temperatures of between 77 and 340K. The results indicated that negative VHg vacancies were introduced. They disappeared, at room temperature, over a period of several weeks. Another mono-vacancy was also observed when the Fermi level was high in the gap. It was tentatively identified as being the VTe vacancy. A recovery stage was observed at temperatures of between 150 and 280K.

F.M.Kiessling, C.Corbel, L.Baroux, S.Rolland, R.Triboulet: Physical Review B, 1995, 52[14], 9925-31