Atomic force microscopy was used to study the structure of freshly-cleaved Cd0.6Mn0.4Te surfaces. The present report complemented previous X-ray diffraction and optical microscopic results which had shown the existence of micro-twins. The atomic force microscopic analysis was performed under ambient conditions and yielded nm-resolution images of single twin lamellae that ranged from 20 to 100nm in width. This was thought to be the first observation, using atomic force microscopy, of such a sub-structure; which was interpreted as constituting evidence for the presence of nanotwins.

M.A.George, M.Azoulay, W.E.Collins, A.Burger, E.Silberman: Journal of Crystal Growth, 1993, 130[1,2], 313-6