The structural characteristics of heavily Cl-doped samples that had been grown by means of molecular beam epitaxy were investigated by means of extended X-ray absorption fine structure measurements. Two bond lengths, between Cl and the nearest Zn atoms, were observed. One was equal to 0.25nm, and the other was equal to 0.28nm. The former was almost equal to the bond length of Se-Zn (0.245nm) in ZnSe; thus indicating that 4-fold coordinated Cl was incorporated into the Se lattice site. This implied the existence of a defect structure, and a possible Cl-Zn vacancy complex was proposed.

K.Akimoto, T.Ogawa, T.Maruyama, Y.Kitajima: Journal of Crystal Growth, 1996, 159, 350-3