Variable energy positron beam and positron annihilation lifetime methods were used to study the DX center in Cl-doped Cd0.8Zn0.2Te at 50K. A short positron effective diffusion length of 27.5nm, and an intensity of 79% for the long-lifetime component, indicated a strong trapping effect at DX centers. A trapping rate of 1.53 x 109/s and a positron lifetime of 335ps at the DX center were deduced. The concentration of DX centers was found to be 5.9 x 1016/cm3; in good agreement with results obtained using Hall effect and thermoelectric effect measurements.

Study of DX center in Cd0.8Zn0.2Te:Cl by positron annihilation S.Fung, Y.Y.Shan, A.H.Deng, C.C.Ling, C.D.Beling, K.G.Lynn: Journal of Applied Physics, 1998, 84[4], 1889-92