The capture and emission coefficients of EL2 traps in semi-insulating material were determined from available experimental data by using a simplified mathematical model which had been derived, by applying singular perturbation methods, from the complete drift-diffusion equations. The capture and emission coefficients were adjusted so that the numerically obtained steady-state and high-field charge dipole solutions of the simplified model matched the available experimental results.

Determination of EL2 capture and emission coefficients in n-GaAs L.L.Bonilla, P.J.Hernando, M.Kindelan, F.Piazza: Applied Physics Letters, 1999, 74[7], 988-90