The use of X-ray reflectivity revealed bi-crystalline (twin) characteristics. Defect segregation at the twin boundary could be seen, whereas the stress was relaxed at the edge of the boundary. Relaxation of the stress resulted in the formation of twins and other defects. As a result of the formation of such defects, a defect-free and stress-free zone or low defect density and small stress zone was created around the defects. Stress, deviations from stoichiometry and non-homogeneous distributions of impurities were considered to be the key factors that induced twins during liquid-encapsulated Czochralski crystal growth of the present material.

New insight into the origin of the twin and grain boundary in InP Y.Han, L.Lin: Solid State Communications, 1999, 110[7], 403-6