The {111} stacking faults and nano-twins in epitaxial thin films on MgO substrates were investigated by means of high-resolution transmission electron microscopy. In many cases, the stacking faults and nano-twins were accompanied by partial dislocations. These partial dislocations could be classified into 2 different types; analogously to the situation in the face-centered cubic structure. One was of Shockley type, with a Burgers vector of (a/3)<112>. The other was of Frank type, with a Burgers vector of (a/3)<111>. The movement of both types of partial could lead to the {111} stacking faults and the {111} twins which were observed in these films.

Investigation of {111} Stacking Faults and Nano-Twins in Epitaxial BaTiO3 Thin Films by High-Resolution Transmission Electron Microscopy. C.H.Lei, C.L.Jia, M.Siegert, K.Urban: Philosophical Magazine Letters, 2000, 80[6], 371-80