A set of X-ray imaging techniques which involved white-beam synchrotron radiation were used to reveal micropipes in crystals. The experimental results and corresponding simulations demonstrated that the micro-pipes were pure super-screw dislocations. The present techniques provided accurate descriptions of the detailed structure of the super-screw dislocations; including the spatial distribution of strain fields, magnitudes of Burgers vectors, dislocation sense, and the surface relaxation effects.

Direct evidence of micropipe-related pure superscrew dislocations in SiC X.R.Huang, M.Dudley, W.M.Vetter, W.Huang, S.Wang, C.H.Carter: Applied Physics Letters, 1999, 74[3], 353-5