The migration of Cr in monocrystals was studied by using X-ray microprobe techniques. The coefficients which were determined at temperatures of between 1273 and 1673K could be described by:

D (cm2/s) = 0.00073 exp[-204(kJ/mol)/RT]

The diffusion coefficients which were obtained were about an order of magnitude higher than those found for polycrystalline CoO. The difference was explained in terms of the effect of a segregation-induced diffusive resistance in polycrystalline specimens.

F.Adam, B.Dupre, K.Kowalski, C.Gleitzer, J.Nowotny: Journal of the Physics and Chemistry of Solids, 1995, 56[8], 1063-8