Polycrystalline samples (with an average grain size of 0.0065mm and little porosity) and monocrystals were sectioned into small parallelopipeds and were exposed to 35S, under a SO2 partial pressure of 0.01atm and an O partial pressure of 0.8 to 1atm. The annealing temperatures ranged from 1173 to 1373K, and the diffusion profiles were determined by sectioning. It was found that the bulk diffusivities (table 55) ranged from 1.07 x 10-13 to 5.0 x 10-13cm2/s, and that the activation energy was 27.6kcal. The grain boundary diffusion coefficients were some 5 orders of magnitude greater than the bulk values (table 56), and the activation energy was about 40kcal. It was concluded that grain boundary diffusion predominated in polycrystalline samples.

M.Benlyamani, F.Ajersch, G.Kennedy: Journal of the Electrochemical Society, 1989, 136[3], 843-6

 

 

 

Table 55

Bulk Diffusivity of S in Cr2O3

 

Temperature (K)

D (cm2/s)

1173

1.1 x 10-13

1223

1.6 x 10-13

1273

3.0 x 10-13

1323

4.4 x 10-13

1373

5.0 x 10-13

 

 

 

Table 56

Grain Boundary Diffusivity of S in Cr2O3

 

Temperature (K)

Method

Dd (cm3/s)

1173

Whipple

7.10 x 10-16

1173

Fisher

3.00 x 10-16

1223

Whipple

1.73 x 10-15

1223

Fisher

9.30 x 10-16

1273

Whipple

3.40 x 10-15

1273

Fisher

1.53 x 10-15

1323

Whipple

5.53 x 10-15

1323

Fisher

2.56 x 10-15

1373

Whipple

7.92 x 10-15

1373

Fisher

4.10 x 10-15