Thin films of the mixed oxides, (1-x)GeO2-xLi2O, where x was between 0.125 and 0.273, were prepared by means of radio-frequency cathodic sputtering. It was shown that the materials were amorphous, and contained a mixture of GeO4 tetrahedra and GeO6 octahedra. The conductivities (table 70) and activation energies (table 71) of as-deposited, glassy and crystallized samples were compared.

K.Awitor, G.Baud, J.P.Besse, M.Jacquet: Materials Chemistry and Physics, 1993, 36[1-2], 183-6

 

 

 

Table 70

Conductivities at 555K of (1-x)GeO2-xLi2O Mixed Oxides

 

x

Condition

 (S/m)

0.125

as-deposited

4.3 x 10-5

0.125

glass

1.6 x 10-4

0.125

polycrystalline

1.8 x 10-8

0.182

as-deposited

6.0 x 10-6

0.182

glass

1.3 x 10-4

0.182

polycrystalline

2.3 x 10-8

 

 

 

Table 71

Activation Energy for Conduction in

(1-x)GeO2-xLi2O Mixed Oxides

 

x

Condition

E (eV)

0.125

as-deposited

0.98

0.125

glass

0.93

0.125

polycrystalline

1.18

0.182

as-deposited

0.80

0.182

glass

0.89

0.182

polycrystalline

1.30