In order to clarify the diffusion of oxide-ion vacancies in this perovskite-type oxide, the tracer diffusion coefficient of oxide ions in La1-xSrxFeO3 (x = 0.1, 0.25 or 0.4) single crystals (table 86) was found by using an 18O/16O tracer gas-phase analysis method. The correlation factor for a vacancy diffusion mechanism in a perovskite-type anion sub-lattice was calculated to be 0.69. Using this value and the non-stoichiometric data, the diffusion coefficient of the oxide ion vacancies was estimated (tables 87). The diffusivity of oxide ions in this perovskite-type oxide was comparable to that in fluorite-type oxides.

T.Ishigaki, S.Yamauchi, K.Kishio, J.Mizusaki, K.Fueki: Journal of Solid State Chemistry, 1988, 73[1], 179-87

 

 

 

Table 86

Tracer Diffusion of Oxide Ions in La1-xSrxFeO3

(Oxygen partial pressure = 6.5kPa)

 

Temperature (C)

x

D (cm2/s)

1100

0.1

2.86 x 10-8

1050

0.1

2.34 x 10-8

1000

0.1

1.10 x 10-8

950

0.1

4.89 x 10-9

900

0.1

3.22 x 10-9

1050

0.25

2.70 x 10-7

1000

0.25

1.25 x 10-7

950

0.25

6.70 x 10-8

900

0.25

3.37 x 10-8

1000

0.4

5.88 x 10-7

 

 

 

Table 87

Diffusion Coefficient of Oxide Ion Vacancies in La1-xSrxFeO3

(Oxygen partial pressure = 6.5kpa)

 

Temperature (C)

x

D (cm2/s)

1100

0.1

1.12 x 10-5

1050

0.1

1.21 x 10-5

1000

0.1

7.41 x 10-6

950

0.1

4.59 x 10-6

900

0.1

4.49 x 10-6

1050

0.25

2.36 x 10-5

1000

0.25

1.32 x 10-5

950

0.25

6.18 x 10-6

900

0.25

6.08 x 10-6

1000

0.4

1.95 x 10-5