Doped substrates were prepared by thermal diffusion from a film, and Cr depth profiles were obtained by means of secondary-ion mass spectrometry. On the basis of these profiles, the Cr diffusivity was estimated for various temperatures (table 96).

J.M.Almeida, G.Boyle, A.P.Leite, R.M.De la Rue, C.N.Ironside, F.Caccavale, P.Chakraborty, I.Mansour: Journal of Applied Physics, 1995, 78[4], 2193-7

Table 96

Diffusivity of Cr in LiNbO3