The migration of Mg in Ti-diffused samples was studied. Secondary ion mass spectrometry was used to obtain Ti/Mg dopant concentration profiles. It was found that Mg in-diffusion slightly affected the Ti concentration profiles in pre-diffused Ti-doped specimens.

F.Caccavale, P.Chakraborty, A.Capobianco, G.Gianello, I.Mansour: Journal of Applied Physics, 1995, 78[1], 187-93