The application, of spatially resolved measurements of fluorescence intensity, to the determination of Nd diffusion profiles was considered. This technique permitted precise determinations to be made of diffusion depth, but the extraction of detailed point-by-point concentration data was not possible. The overall systematic error in the measurement of diffusion coefficients was shown to be about 10%. The diffusion coefficients which were measured were consistent with previous values, but the fluorescence lifetimes were probably shorter than those for bulk Nd-doped material.

M.Hempstead: Journal of Applied Physics, 1993, 74[9], 5483-92