The interdiffusion of thin Cu3Ba2YO7 films and MgO substrates was investigated by means of Rutherford back-scattering spectrometry and scanning electron microscopy. It was found that the measured diffusivities of Ba, Cu and Y in the MgO substrate were much smaller than the published values. The diffusivity of Cu at 950C was equal to 7.1 x 10-23m2/s in monocrystalline films, and equal to 1.9 x 10-23m2/s in amorphous films.

Y.Igarashi, Y.Fujino: Journal of Applied Physics, 1991, 70[12], 7500-3