Thin films were deposited by means of electron beam evaporation, using a MnO or MnO2 source, and were characterized by X-ray and electron diffraction. Coulomb titration curves of MnLixO revealed a potential plateau of 2.9V for compositions ranging from 0.05 to 2. The chemical diffusion coefficient of Li in thin films at 15C was equal to 2.7 x 10-14cm2/s for x-values of between 0 and 0.01, and equal to 2.2 x 10-15cm2/s for x-values of between 0.02 and 0.06. A good reversibility of Li insertion and extraction was demonstrated by cyclic voltammetry data.

L.Chen, J.Schoonman: Solid State Ionics, 1993, 60[4], 227-31