Rutherford back-scattering spectrometry was used to characterize deliberately added Cs impurities in soda-lime glass. The impurities were introduced into the glass matrix by using an ion-exchange diffusion process at room temperature. The Cs diffusion coefficient was deduced from the measured depth profiles. The diffusion of Cs impurities, as stimulated by 280keV Kr+ ion-beam irradiation was also studied. The resultant depth distributions were analyzed by using a model for radiation-enhanced diffusion.

D.E.Arafah, Y.Al-Ramadin: Applied Physics A, 1993, 56[6], 555-9