The electrochemical characteristics of a new material, synthesized by using a sol-gel process, were reported. The kinetics of electrochemical Li insertion were investigated by using alternating-current impedance spectroscopy and pulse relaxation techniques. The variation in the Li chemical diffusion coefficient, as a function of Li content, was compared with equivalent data on the V2O5 parent oxide and was correlated with structural data on this and other oxides. The DLi values, for Li contents of between zero and 0.8, ranged from 10-10 to 10-11cm2/s. It was suggested that the variation in DLi as a function of Li content accounted for the presence of Al3+ and/or additional O atoms between the V2O5 layers. This was consistent with the preferential location of tetrahedrally coordinated Al3+ in the inter-layer spaces.

R.Baddour-Hadjean, J.Farcy, J.R.Pereira-Ramos, N.Baffier: Journal of the Electrochemical Society, 1996, 143[7], 2083-8