Lattice defects in single crystals were characterized by means of X-ray topography and transmission electron microscopy. The crystals had lapped (001) or (011) faces. It was found that some sub-grain boundaries which were observed using X-ray topography were small-angle tilt boundaries. Many dislocations were found in the regions where thick-line contrast was observed in X-ray topographs. Most of them had <100>-type Burgers vectors.

Characterization of Lattice Defects in Strontium Titanate Single Crystals by X-Ray Topography and Transmission Electron Microscopy. J.Yamanaka, J.Yoshimura, S.Kimura: Journal of Electron Microscopy, 2000, 49[1], 89-92