The interdiffusion coefficients of amorphous sinusoidally modulated CuxTi1-x samples were determined by monitoring the decay of the low-angle X-ray scattering intensity of Bragg satellites during annealing. Values of the diffusion coefficient which ranged from 9 x 10-25 to 6.9 x 10-24m2/s were obtained for isothermal annealing at temperatures ranging from 413 to 503K. Overall, the diffusion data for Cu0.5Ti0.5 and Cu0.35Ti0.65 (table 47) could be described by:
D (m2/s) = 1.4 x 10-19[-0.43(eV)/kT]
and
D (m2/s) = 2 x 10-20[-0.36(eV)/kT]
respectively.
A.Bruson, J.C.Y.Noubeyo: Physica Status Solidi A, 1993, 138[1], 199-206
Table 47
Interdiffusion Coefficients for
Compositionally Modulated CuxTi1-x Films
Temperature (K) | x | D (m2/s) |
413 | 0.50 | 9 x 10-25 |
413 | 0.35 | 6.9 x 10-25 |
443 | 0.50 | 1.7 x 10-24 |
443 | 0.35 | 1.25 x 10-24 |
483 | 0.50 | 5.6 x 10-24 |
483 | 0.35 | 3.1 x 10-24 |
503 | 0.50 | 6.9 x 10-24 |