Thin foil specimens of -brass were quenched from 973K, and were annealed at various temperatures between 403 and 473K for various periods. Antiphase domain boundaries and voids were detected by means of transmission electron microscopy. It was found that almost all of the voids were in antiphase boundaries, while a few were in antiphase domains. The diffusion coefficients, as deduced from the shrinkage rate of voids in antiphase domains or in antiphase boundaries, were given by:

domain:     D (cm2/s) = 5 exp[-1.58(eV)/kT]

boundary:     D (cm2/s) = 0.56 exp[-1.29(eV)/kT]

The annealing kinetics of the voids were related to the ordering energy of the brass.

I.Hashimoto, M.Tsukuda, K.Yamamoto, H.Yamaguchi: Journal of the Physical Society of Japan, 1992, 61[11], 4098-105