The migration of Cu and Ti in amorphous samples was measured, at temperatures ranging from 573 to 645K, by using secondary ion mass spectrometry. The experiments were performed on pre-relaxed specimens, and the diffusion coefficients were found to lie between 3.0 x 10-24 and 9.0 x 10-21m2/s. The temperature dependence of the diffusivity was of Arrhenius type, and the data for Cu diffusion (table 72) and Ti diffusion (table 73) could be described by:
Cu: D (m2/s) = 13 exp[-2.73(eV/atom)/kT]
Ti: D (m2/s) = 8.5 x 108exp[-3.82(eV/atom)/kT]
The results suggested the possible existence of a size-dependence of the diffusivity.
S.K.Sharma, M.P.Macht, V.Naundorf: Physica Status Solidi A, 1991, 126[1], 101-8
Table 72
Diffusion of Cu in Fe40Ni40B20
Temperature (K) | D (m2/s) |
573 | 2.4 x 10-23 |
588 | 6.8 x 10-23 |
593 | 7.4 x 10-23 |
597 | 1.1 x 10-22 |
609 | 3.1 x 10-22 |
611 | 2.7 x 10-22 |
618 | 1.0 x 10-21 |
622 | 9.1 x 10-22 |
632 | 2.4 x 10-21 |
638 | 2.7 x 10-21 |
643 | 5.1 x 10-21 |
646 | 8.6 x 10-21 |
Table 73
Diffusion of Ti in Fe40Ni40B20
Temperature (K) | D (m2/s) |
598 | 6.3 x 10-24 |
611 | 2.6 x 10-23 |
613 | 3.0 x 10-23 |
626 | 1.6 x 10-22 |
632 | 3.6 x 10-22 |
643 | 9.7 x 10-22 |