The diffusion of Mn, Cr and Ti in monocrystalline samples was studied at temperatures ranging from 582 to 800K, from 639 to 829K, and from 621 to 747K, respectively. Ion-beam sputtering and secondary ion mass spectrometry were used to determine concentration depth profiles. It was found that the results could be described by the expressions:

Mn:     D (m2/s) = 4.3 x 10-5 exp[-2.01(eV)/kT]

Cr:     D (m2/s) = 2.6 x 10-5 exp[-1.99(eV)/kT]

Ti:     D (m2/s) = 3.7 x 10-5 exp[-1.99(eV)/kT]

These results were consistent with previous high-temperature data. A curvature of the overall Arrhenius plot was attributed to a contribution which arose from divacancies at high temperatures.

Diffusion of Manganese, Chromium, and Titanium in Single Crystalline Copper A.Almazouzi, M.P.Macht, V.Naundorf, G.Neumann: Physica Status Solidi A, 1998, 167[1], 15-28