The particle sizes and dislocation structures in inert-gas condensed nano-crystalline samples were determined by means of high-resolution X-ray diffraction profile analysis. From a knowledge of the variation in dislocation contrast with Bragg reflection, and the effect of twinning upon particle size, well-behaved smooth curves were obtained on suitably modified Williamson-Hall and Warren-Averbach plots. The particle size was between 14 and 30nm; in agreement with transmission electron microscopy results. A root-mean squared strain was explained by the presence of dislocations at a density of about 5 x 1015/m2. The dislocations were found to have a screw character which was probably related to the particle-growth mechanism.

Dislocations, Grain Size and Planar Faults in Nanostructured Copper Determined by High-Resolution X-Ray Diffraction and a New Procedure of Peak Profile Analysis T.Ungár, S.Ott, P.G.Sanders, A.Borbély, J.R.Weertman: Acta Materialia, 1998, 46[10], 3693-9