The details of 2 different planar defects were considered with respect to their relationship to the martensitic transformation. It was shown that the lattice displacements and habit planes of the defects could be explained by assuming that non-conservative antiphase boundaries existed in the parent B2 phase before martensitic transformation. The main difference between the defects was the sequence of shuffled (001) planes. This remained unchanged in the first type, but skipped a plane in the second type. The micro-twin sequence was also clearly affected by the second type.

TEM Investigation of the Microstructure and Defects of Cu-Zr Martensite - Part II: Planar Defects J.W.Seo, D.Schryvers: Acta Materialia, 1998, 46[4], 1177-83