The diffusivity of Ni, close to a Ni/Cu(111) interface was studied by using Auger electron spectroscopic techniques. The estimated bulk volume diffusion coefficients, at temperatures ranging from 350 to 450C, could be described by:

D (m2/s) = 2.9 x 10-3 exp[-239(kJ/mol)/RT]

The present results were consistent with previous ones which had been obtained by using secondary ion mass spectrometric and radio-tracer techniques. This suggested that Auger electron spectroscopy was a powerful technique for measuring diffusion coefficients by monitoring the dissolution of ultra-thin deposits (in systems with total solubility). It was concluded that mass transport in close proximity to an interface was not significantly altered (that is, by less than an order of magnitude).

Mass Transport of Nickel in Close Proximity to a Ni/Cu(111) Interface Z.Tôkei, D.L.Beke, J.Bernardini, A.Rolland: Scripta Materialia, 1998, 39[8], 1127-32