The transient characteristics of x-axis inversion in AT-cut quartz plates were studied. The resonance frequency of the quartz plate was monitored throughout the heat treatment process which induced x-axis inversion. The inversion could be detected via a resonant frequency change. It was observed that the critical temperature for x-axis inversion decreased with film thickness. An expansion of the x-axis inverted area was observed at temperatures greater than the critical one.

T.Uno: Japanese Journal of Applied Physics - 1, 1997, 36[5B], 3000-3