Grain boundaries in additive-free samples exhibited various types of conductive mode contrast, depending upon the electrical properties. Electron beam scattering patterns were used to determine the misorientation of grain boundaries, showing certain types of conductive mode contrast, in order to correlate electrical properties with grain-boundary structure. No correlations were apparent when using the coincident-site lattice model, but other criteria suggested that grain-boundary electrical properties might be crystallographically controlled.

J.D.Russell, D.C.Halls, C.Leach: Journal of Materials Science, 1997, 32[5], 4585-9