The Cu diffusivity in chalcopyrite was studied directly, using 64Cu as a radioactive tracer. In the case of diffusion from a thin surface layer, the diffusion coefficients at 380 and 430C varied from 10-8 to 10-9cm2/s. In the case of diffusion from a volume source at 400C, a value of 10-10cm2/s was deduced from the diffusion profiles. The electromigration of Cu was demonstrated by applying a high electric field to the sample and monitoring the redistribution of 64Cu which had already been thermally diffused into the sample.

K.Gartsman, L.Chernyak, V.Lyahovitskaya, D.Cahen, V.Didik, V.Kozlovsky, R.Malkovich, E.Skoryatina, V.Usacheva: Journal of Applied Physics, 1997, 82[9], 4282-5