A study was made of the pattern of lattice curvature near to the high-angle random interfaces of deformed 6N-purity bicrystals. Curvature data were obtained from electron back-scattering diffraction patterns, using orientation-imaging microscopy. The concept of geometrically necessary dislocations was used to describe the observations. The samples were channel-die compressed, perpendicular to the interface, to plastic strain levels of 0.1 or 0.3. At the former strain level, the main feature was the development of pile-ups of geometrically necessary dislocations (lattice curvature) near to the interface. At a strain level of 0.3, there was a sharp change in the distribution. The nature of this change suggested that the interface had absorbed (or emitted) some components of the nearby geometrically necessary dislocation field. There was an associated change, in the local character of the interface, towards a broader dispersion of misorientations.

Observations of Lattice Curvature near the Interface of a Deformed Aluminium Bicrystals. S.Sun, B.L.Adams, W.E.King: Philosophical Magazine A, 2000, 80[1], 9-25