A structural study was made of fused (001) wafer interfaces. The geometry of the dislocation network which accommodated the twist and lattice mismatch was determined by using a geometrical approach. Two different types of misfit were observed. One of them occurred when no twist was present, and a 3.7% lattice-mismatch was relaxed by a regular square network of pure edge dislocations. When an additional twist was present, a square network of dislocations again resulted, but here the dislocations had a mixed nature; with 60º dislocations being observed. Some of them formed closed defect circuits, while others were thought to accommodate a small tilt.

L.Sagalowicz, A.Rudra, A.Syrbu, J.Behrend, F.Salomonsson, K.Streubel, M.Hammar, J.Bentell: Philosophical Magazine Letters, 1997, 76[6], 445-52