Diffusion Phase Formation in the Cu-Sn Nanofilms System
Processes involved in the structure and phase formation in the thin film systems Sn(4 nm)/Cu(14 nm) and Сu(14 nm)/Sn(8 nm) in the temperature range 130-500 оС were studied using “in situ” electron imaging and Transmission Electron Microscopy methods (TEM). Solubility of Sn α – solid solution Cu-Sn has been determined from the changes in the lattice parameter. This work was performed in the framework of the Swedish Institute supported cooperative research project “Thin metal films – the interplay of structure diffusion and boundaries” (SI dnr 00699/2009).
B.S. Bokstein, A.O. Rodin and B.B. Straumal
A. R. Rennie et al., "Diffusion Phase Formation in the Cu-Sn Nanofilms System", Defect and Diffusion Forum, Vols. 309-310, pp. 167-176, 2011