Defects and Diffusion in Ceramics XII
This twelth volume in the series includes 589 abstracts of ceramics research papers, together with original papers on other major material groups, and theory: Studies of the EPR Parameters and Local Structure of Co2+ in ZnO, Structural and Electrical Changes in BIMNVOX Oxide-Ion Conductor, Effect of Film Thickness on Some Optical Properties of Sprayed Pyrolysis Cobalt Oxide Thin Films, A Novel Experimental Approach to Compatible Carbon Nanofiber Diffusion around Circular Carbon Micro-Post Surfaces, Structural Rigidity, Percolation and Transition-Temperature Study of the Ge19Se81-xSbx System, Physical Analysis of Structural Transformation in Ge-Incorporated a-SbxSe100-x System, Study of the Glass Transition Temperature of (Se100-xBix)90Te10 Alloys, A Boost-Up Method of MEMS-Bulk-Micromachining towards C-MEMS Fabrication for Sensing and Manipulating Bioparticles, Electrical and Dielectric Properties of Te15(Se100-xBix)85 Amorphous Glassy Alloys, Low-Power Operation of Pt/Porous Si Schottky-Diode Gas-Sensor through a Reduction in its Breakdown Voltage, Surface Composition Transformation of Thin Film based on Al Grown by CBE on the (001) GaAs Surface Due to Laser Assistance, Characterization and Properties of Iron/Silica-Sand-Nanoparticle Composites, Al-Film/Si-Substrate System Nanoscratching Response Based upon Molecular Dynamics Simulation in NEMS, Probing the Activation Migration Enthalpies of Dislocations in 2024 Aircraft Material using Nuclear and Electrical Techniques, A Numerical Simulation Approach to Convection, Buoyancy Effect, Microfiltration and Flow Analysis as an Influential Lead for Designing and Dimensioning in MEMS, Prediction of Transient Temperature Distribution, HAZ Width and Microstructural Analysis of Submerged Arc-Welded Structural Steel Plates, Evaluation of the Effect of Catalyst Pore-Size Distribution on the Effectiveness Factor in Ethylbenzene Dehydrogenation by Orthogonal Collocation.
Review from Ringgold Inc., ProtoView: Original papers make up the first half of this book and are sectioned into ceramics, semiconductors, metals and theory/simulation. The second half is devoted to an annual retrospective which provides paragraph long abstracts of articles that have appeared in the past year. This makes the twenty six page author index useful. A materials index is also provided along with a keyword index. The authors come from primarily academic positions in physics, optoelectronics and mechanical engineering.