A TEM Study of Bubbles Growth with Temperature in Xenon and Krypton Implanted Uranium Dioxide
Transmission electron microscopy (TEM) characterizations were carried out on a set of UO2 thin foils previously implanted at room temperature with 400 keV Xe2+ and 250 keV Kr2+ ions at the fluence 7.1015 at.cm-2 (equivalent to 1 at.%/at. UO2). The experiment was devoted to the study of the evolution of the fission gases bubbles populations with increasing temperature. Annealings were performed in the laboratory furnace at 600°C, 800°C, 1000°C for 12h, 1400°C for 4h and 1500°C for 2h under Ar-5%H2 atmosphere. For each annealing condition and for as-implanted specimens the bubble population has been characterized in size and number density. A comparison between Xe and Kr has been done that showed a similar behaviour. Globally, from the as-implanted sample to the 1500°C annealed, the bubbles growth phenomenon and the microstructure evolution with temperature was put in relieve.
I. Bezverkhyy, S. Chevalier and O. Politano
A. Michel et al., "A TEM Study of Bubbles Growth with Temperature in Xenon and Krypton Implanted Uranium Dioxide", Defect and Diffusion Forum, Vols. 323-325, pp. 191-196, 2012