Determination of Diffusion Coefficients with Quantitative X-Ray Microanalysis at High - Spatial Resolution

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This paper present the determination of concentration profiles of an Mg Al diffusion couple that was obtained with a high resolution field emission scanning electron microscope, the Hitachi SU-8000 equipped with a SDD EDS detector. From these concentration profiles, the inter-diffusion coefficient is determined with the Boltzmann-Matano technique. The advantages and disadvantages of working at high and low beam energy for quantitative x-ray microanalysis are highlighted. The f ratio method is used in this work to convert the x-ray intensities into composition.

Info:

Periodical:

Defect and Diffusion Forum (Volumes 323-325)

Edited by:

I. Bezverkhyy, S. Chevalier and O. Politano

Pages:

61-67

Citation:

R. Gauvin et al., "Determination of Diffusion Coefficients with Quantitative X-Ray Microanalysis at High - Spatial Resolution", Defect and Diffusion Forum, Vols. 323-325, pp. 61-67, 2012

Online since:

April 2012

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$38.00

[1] R. Gauvin and P. Michaud, Microscopy and Microanalysis, Vol. 15, 2, (2009), p.488.

[2] P. Horny, E. Lifshin, H. Campbell and R. Gauvin, Microscopy & Microanalysis, Vol. 16, 6, (2010), p.821.

[3] J. Philibert, in: Atom movements, Diffusion and mass transport in solids, Les Éditions de physique, Les Ulis, France (1991).

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