Depth Resolved Positron Annihilation Studies of Si and Metal Silicides


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Depth resolved positron beam results of Si and metal silicides are highlighted in terms of identifying the nature of vacancy defects in amorphous and disordered Si and phase transformation and defect evolution as a consequence of silicide formation, respectively.



Edited by:

B.N. Ganguly and G. Brauer




G. Amarendra and S. Abhaya, "Depth Resolved Positron Annihilation Studies of Si and Metal Silicides", Defect and Diffusion Forum, Vol. 331, pp. 127-136, 2012

Online since:

September 2012




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