Depth Resolved Positron Annihilation Studies of Si and Metal Silicides
Depth resolved positron beam results of Si and metal silicides are highlighted in terms of identifying the nature of vacancy defects in amorphous and disordered Si and phase transformation and defect evolution as a consequence of silicide formation, respectively.
B.N. Ganguly and G. Brauer
G. Amarendra and S. Abhaya, "Depth Resolved Positron Annihilation Studies of Si and Metal Silicides", Defect and Diffusion Forum, Vol. 331, pp. 127-136, 2012