Preparation and Characterization of ZnSe/SiO2 Nanocomposite

Abstract:

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Semiconductor ZnSe nanocrystals (NCs)-doped SiO2 glasses (designated as ZnSe/SiO2 nanocomposites) were prepared successfully by using sol-gel method and in-situ growth technique. The nanocomposite was characterized by X-ray diffraction (XRD) patterns, UV-Vis absorption spectra and X-ray Photoelectron Spectroscopy (XPS). The XRD results show that ZnSe NCs is zinc blende structure and the mean size is smaller than 5nm in diameter. UV-Vis absorption spectra reveals that the size of the NCs is influenced by synthesis conditions such as doping concentration and thermal treatment, and XPS together with XRD can prove that silica matrix plays an important role in enhancing the NCs’ stability.

Info:

Edited by:

M. Gupta and Christina Y.H. Lim

Pages:

71-74

DOI:

10.4028/www.scientific.net/JMNM.23.71

Citation:

F. Kong et al., "Preparation and Characterization of ZnSe/SiO2 Nanocomposite", Journal of Metastable and Nanocrystalline Materials, Vol. 23, pp. 71-74, 2005

Online since:

January 2005

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Price:

$35.00

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