Scale-Invariant Drain Current in Nano-FETs

Abstract:

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Starting from a three-dimensional transport model in the Landauer-Buttiker formalism we derive a scale-invariant expression for the drain current in a nano-transistor. Apart from dimensionless external parameters representing temperature, gate-, and drain voltage the normalized drain current depends on two dimensionless transistor parameters which are the characteristic length l and -width w of the electron channel. The latter quantities are the physical length and -width of the channel in units of the scaling length  = ~(2mF )􀀀1=2. Here F is the Fermi energy in the source contact and m is the e ective mass in the electron channel. In the limit of wide transistors and low temperatures we evaluate the scale-invariant ID􀀀VD characteristics as a function of the characteristic length. In the strong barrier regime, i. e. for l & 20 long-channel behavior is found. At weaker barriers source-drain tunneling leads to increasingly signi cant deviations from the long-channel behavior. We compare with experimental results.

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Periodical:

Pages:

49-61

DOI:

10.4028/www.scientific.net/JNanoR.10.49

Citation:

U. Wulf and H. Richter, "Scale-Invariant Drain Current in Nano-FETs", Journal of Nano Research, Vol. 10, pp. 49-61, 2010

Online since:

April 2010

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