Variable Rank Differential Smoothing Technique for Electron Lifetime Calculation in Dye-Sensitized Solar Cells


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The free electron lifetime is a key factor in determining the performance of a dye-sensitized solar cells (DSCs). Open-circuit voltage-decay (OCVD) suggested by Zaban is a useful technique to provide continuous reading of the electron lifetime as a function of device’s open-circuit voltage (Voc), but the data processing has never been studied in order to get high accuracy electron lifetime value from the high resolution decaying voltage data. In this manuscript, we introduce the variable rank differential smoothing (VRDS) technique in the electron lifetime data processing. We find it can lessen data loss and give highly accurate electron lifetime value in the range of Voc decaying. We also get the effective recombination order values based on the VRDS technique, which indicate different potential processes due the two different values. These results show the detail kinetics information and microscopic device physic characteristics, which are very important to understand the device working mechanism and meaningful for realizing higher performance solar cells.








W. Peng et al., "Variable Rank Differential Smoothing Technique for Electron Lifetime Calculation in Dye-Sensitized Solar Cells", Journal of Nano Research, Vol. 48, pp. 1-7, 2017

Online since:

July 2017




* - Corresponding Author

[1] A. Yella, H. W. Lee, H. N. Tsao, Science, 334(2011) 629-634.

[2] L. Y. Han, A. Islam, H. Chen, Energy Environ. Sci., 10(2012) 6057-6060.

[3] T. H. Zhang, L. Y. Piao, S. L. Zhao, Z. Xu, Q. Wu, C. Kong, Chinese Phys. B, 21(2012) 1664-1671.

[4] B. O'Regan, M. Grätzel, Nature, 353(1991) 737-740.

[5] K. G. Deepa, P. Lekha, S. Sindhu, Sol. Energy, 86(2012) 326-330.

[6] S. Muduli, O. Game, V. Dhas, Solar Energy, 86(2012) 1428-1434.

[7] Y. Liou, Y. J. Chen, B. Chen, L. Lee, C. Huang, Surface and Coatings Technology, 231(2013) 535–538.

[8] A. Zaban, M. Greenshtein, J. Bisquert, CHEMPHYSCHEM, 4(2003) 859-864.

[9] C. C. Yang, Y. R. Zheng, Journal of Power Sources, 201(2012) 387-394.

[10] J. T. Park, D. K. Roh, W. S. Chi, R. J. Patel, J. H. Kim, Journal of Industrial and Engineering Chemistry, 18(2012) 449-455.

[11] H. Yang, H. Inokawab, Solid-State Electronics, 76(2012) 5–7.

[12] B. An, W. Hu, P. L. Burn, P. Meredith, J. Phys. Chem. C, 114(2010) 17964-17974.

[13] W. Peng, Y. Zeng, H. Gong, Y. Q. Leng, Y. Yan, W. Hu, Micro & Nano Letters, 8(2013) 86-89.

[14] J. Steinier , Y. Termonia, J. Deltour, Anal. Chem. 44(1972) 1906–(1909).

[15] H. Madden, Anal. Chem. 50(1978) 1383–1386.

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